Fuzzy Intervals As Foundation Of Metrological Support For Computations With Inaccurate Data

Authors

Konstantin K. Semenov, Saint-Petersburg State Polytechnical UniversityFollow
Gennady N. Solopchenko, Saint-Petersburg State Polytechnical University
Vladik Kreinovich, The University of Texas at El PasoFollow

Publication Date

9-2014

Comments

Technical Report: UTEP-CS-14-30a

Short version published in Proceedings of the International Conference on Advanced Mathematical and Computational Tools in Metrology and Testing AMTCM'2014, St. Petersburg, Russia, September 9-12, 2014, Paper 088; full paper published in: Franco Pavese (ed.), Advanced Mathematical and Computational Tools in Metrology and Testing AMTCM'X, World Scientific, Singapore, 2015, pp. 340-348.

Abstract

In this paper, we discuss the possibility of using the formalism of fuzzy intervals as a basis for computational metrology. We consider advantages of using fuzzy intervals instead of the traditional intervals as a characteristic of uncertainty of the results of computations with inaccurate data.