Title
Comparison Analysis of Efficiency for Step-Down and Step-Up Stress Accelerated Life Testing
Publication Date
6-1-2012
Document Type
Article
Abstract
We compare the practical efficiency of step-down and step-up stress accelerated life tests based on four different criteria through theoretical studies, and intensive Monte-Carlo simulations. We consider Weibull, and lognormal distributions for the lifetime of products at each stress level; and deal with type-I, and type-II censoring schemes. Through theoretical and simulation studies, we demonstrate that under a type-I censoring scheme, the step-down test plan results in a shorter mean failure time of testing units than that of the step-up stress accelerated life test. With type-II censoring, the step-down test is also preferred for products with long lifetimes, while the step-up procedure works better applied to units with early and occasional failures.
Comments
R. Wang, N. Sha, B. Gu and X. Xu, "Comparison Analysis of Efficiency for Step-Down and Step-Up Stress Accelerated Life Testing," in IEEE Transactions on Reliability, vol. 61, no. 2, pp. 590-603, June 2012.
doi: 10.1109/TR.2012.2182816