Fault tolerant flip-flop design for ultra-low power subthreshold logic

Gaurav Avadhut Dukle, University of Texas at El Paso


Low power consumption and radiation hardness are generally competing requirements for space electronics as well as many earth-bound high reliability applications. Recently, subthreshold logic has emerged as a technology that can deliver the theoretical minimum energy per computation by running at ultra-low levels. The resulting performance degradation is tolerable due the dramatic increase in energy efficiency. However, operating circuits at such low voltages decreases the critical charge---Qcrit---required to corrupt the contents of memories and sequential elements. The marriage of subthreshold logic and high-reliability electronics is inevitable, yet there has been to date no investigation of the effects of radiation on circuits that operate at such low voltages. This thesis provides a comprehensive comparison of a variety of traditional flip-flop designs at subthreshold levels---not just in terms of performance, power and area but radiation hardness as well. Furthermore, a novel flip-flop design is presented, which is optimized for robust subthreshold operation.^

Subject Area

Engineering, Electronics and Electrical

Recommended Citation

Dukle, Gaurav Avadhut, "Fault tolerant flip-flop design for ultra-low power subthreshold logic" (2007). ETD Collection for University of Texas, El Paso. AAI1444081.